REM
Scanning Electron Microscopy
Scanning electron microscopy (SEM) is used to investigate surface structures.
An electron beam scans the sample surface and signals resulting in the interactions between electron beam and sample are detected and build up the image on a computer monitor. As a necessary prerequisite for SEM samples have to be dry and conductive. This is achieved by appropriate preparation methods and coating with a thin gold layer. The special case ESEM (Environmental Scanning Electron Microscopy) allows sample investigation without preparation.
Main emphasis lays on the investigation of various plant surfaces with a strong focus on trichomes. But studies also deal with bacteria, fungi, lichens and also insects and spiders (in cooperation with the Division of Zoology).